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Luminescence measuring instrument Product List and Ranking from 4 Manufacturers, Suppliers and Companies | IPROS GMS

Luminescence measuring instrument Product List

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Thermoluminescence measurement device TL-2000

Thermoluminescence measurement device TL-2000

The TL-2000 is the latest thermoluminescence measurement device developed primarily for the detection of irradiated food.

The notification No. 0529004 from the Food Safety Agency introduces the TL-2000 thermoluminescence measurement device manufactured by Nanogray. The TL-2000 complies with the TL method standards, which are considered the standard analysis method for irradiated spices. The TL-2000 was developed with the themes of being domestically produced, cost-effective, and high-performance, primarily for the detection of irradiated food. Additionally, it can also be used for thermoluminescence and chemiluminescence measurements, such as dating and TL material analysis.

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  • Food Testing/Analysis/Measuring Equipment
  • Luminescence measuring instrument

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TL/OSL measurement device "TP-5000"

TL/OSL measurement device "TP-5000"

OSL measurement can be performed using blue LEDs and infrared LEDs! Repeated measurements are also possible.

We would like to introduce the 'TP-5000', which we handle and is capable of TL/OSL measurement and X-ray irradiation. Since the radiation source is X-ray and it has an interlock function, there is no need for a radiation safety officer or the establishment of controlled areas. Additionally, it allows for high-precision measurements using single photon counting and TL measurements with a heater up to 500°C, and it is also possible to output measurement data in CSV format. 【Features】 ■ No need for a radiation safety officer or the establishment of controlled areas ■ High-precision measurements using single photon counting ■ TL measurements can be performed with a heater up to 500°C ■ OSL measurements can be performed using blue LED and infrared LED ■ Repeated measurements can be conducted through sequence settings ■ Measurement data can be output in CSV format *For more details, please download the PDF (English version) or feel free to contact us.

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  • Other measurement, recording and measuring instruments
  • Luminescence measuring instrument

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Analysis Case: Analysis of Defect Levels in Gallium Nitride

Analysis Case: Analysis of Defect Levels in Gallium Nitride

You can obtain various physical property information such as point defect formation energy, charge, and optical transitions!

Our organization conducts an analysis of defect levels in wide bandgap semiconductor gallium nitride (GaN) using first-principles calculations. Gallium nitride (GaN), a wide bandgap semiconductor, is primarily used in the field of power devices, and in recent years, there has been an increasing demand for applications such as rapid chargers and 5G communication base stations. Here, we present a case study analyzing the defect levels formed by nitrogen vacancies (VN) in GaN using first-principles calculations. [Measurement and Processing Methods] ■ [PL] Photoluminescence Method ■ Computational Science, AI, Data Analysis *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis
  • Luminescence measuring instrument

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YWafer Mapper GS4

YWafer Mapper GS4

Photoluminescence and film thickness mapping measurement equipment for 2, 3, and 4-inch wafers for LED/LD production Wafer PL

Y Systems was established based on its achievements in measurement and evaluation technologies in research environments for blue laser diodes (LD) and light-emitting diodes (LED). In 2001, we commercialized the first unit of our current flagship product, the Y-Wafer Mapper, with our staff. We will continue to play a part in the cutting-edge technology of solid-state lighting.

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